Our lab equipment

Photoelectron Spectroscopy (PES)

  • Small spot XPS with FOCUS 500 x-ray monochromator (SPECS), UV source and Phoibos 150 MCD analyzer (SPECS) and LEED. 
  • Further XPS spectrometers with hemispherical analyzers, standard x-ray sources, LEED for specific applications.
  • Kelvin Probe and other complementary techniques. 

Photoelectron Diffraction (XPD, LEED)

  • Angle resolved XPS spectrometer with Phoibos 100 MCD analyzer (SPECS), suitable for large samples. Both the polar and the azimuthal angle are automatically controlled during the measurement.

Raman Microscopy & Spectroscopy (Raman)

Infrared Microscopy & Spectroscopy (FT-IR)

Scanning Electron Microscopy (SEM)

  • HITACHI SU8030 scanning electron microscope with Bruker-EDX (energy dispersive x-ray spectroscopy).

Atomic Force Microscopy (AFM)


  • Theory vs. Experiment (For example, XPD and XAS simulations using standard programme packages)


LISA+ Equipment

Member of the Lisa+ Network offering a large variety of facilites. The folloing LISA+ devices are managed by our group:

Scanning Tunneling Microscopy (STM)

Scanning Auger Microscopy (AES, SAM)