Our lab equipment
Photoelectron Spectroscopy (PES)
- Small spot XPS with FOCUS 500 x-ray monochromator (SPECS), UV source and Phoibos 150 MCD analyzer (SPECS) and LEED.
- Further XPS spectrometers with hemispherical analyzers, standard x-ray sources, LEED for specific applications.
- Kelvin Probe and other complementary techniques.
Photoelectron Diffraction (XPD, LEED)
- Angle resolved XPS spectrometer with Phoibos 100 MCD analyzer (SPECS), suitable for large samples. Both the polar and the azimuthal angle are automatically controlled during the measurement.
Raman Microscopy & Spectroscopy (Raman)
- Confocal Raman-Microscope (HORIBA-JY, HR 800) with a confocality of about 2 microns
Infrared Microscopy & Spectroscopy (FT-IR)
- Bruker FT IR VERTEX 70v (vacuum) with MIRacle ATR-unit (1 reflection) and HYPERION 2000 infrared microscope.
Scanning Electron Microscopy (SEM)
- HITACHI SU8030 scanning electron microscope with Bruker-EDX (energy dispersive x-ray spectroscopy).
Atomic Force Microscopy (AFM)
- Nanoscope III (Digital Instruments)
- Theory vs. Experiment (For example, XPD and XAS simulations using standard programme packages)